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Research

Research

  • Fabrication and study of properties of the K+, Ag+, Cu+, Cu2+ and Li+ optical waveguides in dielectric materials
  • Fabrication and study of properties of special optical glasses containing the ions of d- a f-elements
  • Study of properties of surface layers fabricated by ion implantation
  • Diffusion processes occurred by ion exchange
  • Localized doping of lasing active ions into glass substrates

Experiments

  • Equipment for fabrication of optical waveguides by thermal ion exchange
  • Equipment for the electric field assisted ion exchange

Measurements methods

M-line spectroscopy (Metricon Prism Coupler)

The Metricon Model Prism Coupler utilizes advanced optical waveguiding techniques to rapidly and accurately measure both the thickness and the refractive index/birefringence of dielectric and polymer films as well as refractive index of bulk materials at five wavelenghts (473, 633, 964, 1311 or 1552 nm). The method offers unique advantages over conventional refractometers and instruments based on ellipsometry or spectrophotometry.

M-line spectroscopy (Metricon Prism Coupler)
The Metricon Model Prism Coupler.
  • completely general knowledge of optical properties of film/substrate required,
  • routine index resolution of ±.0005 (accuracy of up to ±.0001 available for many applications),
  • routine index resolution of ±.0003 (resolution of up to ±.00005 available for many applications),
  • high accuracy index measurement of bulk materials,
  • rapid characterization of thin films or diffused optical waveguides,
  • simple measurement of index vs wavelength,
  • options to measure waveguide loss,
  • wide index measurement range (1.0 – 3.35).

Dark Mode Spectroscopy (671 nm) & Prisms-coupling Mode Spectroscopy (632 nm)

Refractive index depth profile and parameters of surface optical layers (i.e. refractive index increment, surface refractive index n0)

He-Ne laser
Characterization of optical properties by the Prism-coupling Mode Spectroscopy (He-Ne laser, 632 nm), photo: Ales Novak

Optical Polarization Microscope

Control of surface quality, striae visualization and depths of the optical layers

Habilitation thesis

"Inorganic materials for photonics application" - P. Nekvindova, 2016

Recent and current dissertation thesis

"Study of nonlinear optical properties of metal nanoparticles prepared in inorganic materials" - S. Vytykacova (current)

"Study of the luminescence properties of lanthanides in dielectric materials with respect to the crystal field influence" - J. Cajzl (current)

"Development of novel erbium-ytterbium silicate glass for planar optical waveguide amplifier" - S. Stanek (current)

"Preaparation and optical properties study of a new silicate glasses doped by laser active ions for photonics purposes" - S. Stara-Janakova, 2011

"The study of fabrication and properties of planar optical waveguides in dielectric materials" - B. Svecova, 2010

Recent diploma thesis

"The study of optical properties of nanocrystal diamond thin films" - B. Akhetova, 2016

"Influence of silver metal nanoparticles on properties of glasses containing erbium ions" - B. Chladekova, 2016

"Fabrication of thin optical layer containing copper via sol-gel method, ion exchange and ion implantation" - P. Vařák, 2016

"Study of preparation and properties of silicate glasses containing silver nanoparticles" - S. Vytykacova, 2014

"Erbium in the lithium niobate structure and its luminescence properties" - J. Cajzl, 2012

"Characterization of optical properties of waveguides in the new Zn-Er,Yb silicate glasses" - S. Stanek, 2011

"Effect of conductivity and structure in the electric field assisted process of optical waveguides burying in silicate glasses" - J. Altsmid, 2011

"Study of optical waveguides fabricated by ion exchange in erbium and ytterbium doped silicate glasses" - J. Malek, 2009

"Ion exchange fabrication and study of the Cu(I) planar waveguides in novel silicate glasses" - H. Malichova, 2007

"Porous glass doping by Er3+ for photonics applications" - S. Rubas, 2007

Collaborations

Institutes of Czech Academy of Science:

   Nuclear Physics Institute
   Institute of Physics
   Institute of Photonics and Electronics
   Institute of Chemical Process Fundamentals
  

Faculty of Mathematics and Physics (Charles University Prague)

Czech Technical University in Prague:

   Faculty of Electrical Engineering
   Faculty of Nuclear Sciences and Physical Engineering
  

TU Wien, Austria

Helmholtz-Zentrum Dresden-Rossendorf, Germany

IFAC CNR Florence, Italy

SQS vlaknova optika a.s., Czech Republic

Preciosa, Czech Republic

Updated: 1.11.2016 21:31, Author: Blanka Švecová

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